8V182512IDGGREP
Order the 8V182512IDGGREP - Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers | DGG | 64 | -40 to 85 from Texas Instruments.
Key Specifications
| Complete manufacturer part number | 8V182512IDGGREP |
|---|---|
| Manufacturer | Texas Instruments |
| Description | Order the 8V182512IDGGREP - Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers | DGG | 64 | -40 to 85 from Texas Instruments. |
| Package / case | TSSOP (DGG) |
| Product category | Electronic component |
| Pins | 64 |
| Operating temperature (exact ordering record) | -40 to 85 °C |
| Standard quantity / packing | 2,000 | LARGE T&R |
| Number of channels | 18 |
| IOL (max) (mA) | 32 |
| IOH (max) (mA) | -32 |
| Input type | TTL-Compatible CMOS |
| Output type | 3-State |
| Features | Balanced outputs, Bus-hold, Damping resistors, Partial power down (Ioff), Positive input clamp diode, Very high speed (tpd 5-10ns) |
| Technology family | LVT |
| Rating | HiRel Enhanced Product |
| In stock | Contact for availability |
| Unit price | Request a quote |
| Lead time | To be confirmed |
Technical documentation and image source
The complete ordering code and the fields shown come from the cited manufacturer record. Remaining specifications and product appearance await verification. Listing does not imply current production or stock availability.
Some exact-order specifications remain to be confirmed in the manufacturer documentation.