SN74BCT8374ADW
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops
Key Specifications
| Complete manufacturer part number | SN74BCT8374ADW |
|---|---|
| Manufacturer | Texas Instruments |
| Description | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
| Package / case | SOIC (DW) |
| Product category | Electronic component |
| Pins | 24 |
| Rating | Catalog |
| RoHS compliant | Yes |
| REACH | Yes |
| Lead finish / Ball material | NiPdAu |
| MSL rating / Peak reflow | Level-1-260C-UNLIM |
| Standard quantity / packing | 25 | TUBE |
| Operating temperature | 0 to 70 °C |
| In stock | Contact for availability |
| Unit price | Request a quote |
| Lead time | To be confirmed |
Technical documentation and image source
The complete ordering code and the fields shown come from the cited manufacturer record. Remaining specifications and product appearance await verification. Listing does not imply current production or stock availability.
Some exact-order specifications remain to be confirmed in the manufacturer documentation.