SN74LVTH18646APM
Order the SN74LVTH18646APM - 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers | PM | 64 | -40 to 85 from Texas Instruments.
Key Specifications
| Complete manufacturer part number | SN74LVTH18646APM |
|---|---|
| Manufacturer | Texas Instruments |
| Description | Order the SN74LVTH18646APM - 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers | PM | 64 | -40 to 85 from Texas Instruments. |
| Package / case | LQFP (PM) |
| Product category | Electronic component |
| Pins | 64 |
| Operating temperature (exact ordering record) | -40 to 85 °C |
| Standard quantity / packing | 160 | JEDEC TRAY (10+1) |
| Number of channels | 18 |
| IOL (max) (mA) | 32 |
| IOH (max) (mA) | -32 |
| Input type | TTL-Compatible CMOS |
| Output type | 3-State |
| Features | Balanced outputs, Bus-hold, Partial power down (Ioff), Positive input clamp diode, Very high speed (tpd 5-10ns) |
| Technology family | LVT |
| Rating | Catalog |
| In stock | Contact for availability |
| Unit price | Request a quote |
| Lead time | To be confirmed |
Technical documentation and image source
The complete ordering code and the fields shown come from the cited manufacturer record. Remaining specifications and product appearance await verification. Listing does not imply current production or stock availability.
Some exact-order specifications remain to be confirmed in the manufacturer documentation.